Mahatme, N.N.: search on Z-Library

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1

Basic biostatistics for post-graduate students

Dakhale, GaneshN, Hiware, SachinK, Mahatme, MohiniS, Shinde, AbhijitT

Journal:

Indian Journal of Pharmacology

Year:

2012

Language:

english

File:

PDF, 222 KB

english, 2012

2

An SEU-Tolerant DICE Latch Design With Feedback Transistors

Wang, H.-B., Li, Y.-Q., Chen, L., Li, L.-X., Liu, R., Baeg, S., Mahatme, N., Bhuva, B. L., Wen, S.-J., Wong, R., Fung, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

2015

Language:

english

File:

PDF, 817 KB

english, 2015

3

Analysis of Temporal Masking Effects on Master and Slave Type Flip-Flop SEUs and Related Applications

Chen, R. M., Mahatme, N. N., Diggins, Z. J., Wang, L., Zhang, E. X., Chen, Y. P., Liu, Y. N., Narasimham, B., Witulski, A. F., Bhuva, B. L., Fleetwood, D. M.

Journal:

IEEE Transactions on Nuclear Science

Year:

2018

Language:

english

File:

PDF, 1.01 MB

english, 2018

4

An efficient technique to select logic nodes for single event transient pulse-width reduction

Mahatme, Nihaar N., Chatterjee, Indranil, Patki, Akash, Limbrick, Daniel B., Bhuva, Bharat L., Schrimpf, Ronald D., Robinson, William

Journal:

Microelectronics Reliability

Year:

2013

Language:

english

File:

PDF, 307 KB

english, 2013

5

[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - Design of aging aware 5 Gbps LVDS transmitter for automotive applications

Jagannathan, Srikanth, Abhishek, Kumar, Mahatme, Nihaar, Yilmaz, Ender

Year:

2018

Language:

english

File:

PDF, 313 KB

english, 2018

6

Comparison of Combinational and Sequential Error Rates for a Deep Submicron Process

Mahatme, N. N., Jagannathan, S., Loveless, T. D., Massengill, L. W., Bhuva, B. L., Wen, S.-J., Wong, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

2011

Language:

english

File:

PDF, 588 KB

english, 2011

7

[IEEE 2012 IEEE International SOI Conference - Napa, CA, USA (2012.10.1-2012.10.4)] 2012 IEEE International SOI Conference (SOI) - Radiation hardness aspects of advanced FinFET and UTBOX devices

Claeys, C., Aoulaiche, M., Simoen, E., Griffoni, A., Kobayashi, D., Mahatme, N. N., Reed, R. A., Schrimpf, R. D., Agopian, P. G. D., Martino, J. A.

Year:

2012

Language:

english

File:

PDF, 973 KB

english, 2012

8

[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Total ionizing dose effects on ultra thin buried oxide floating body memories

Mahatme, N. N., Schrimpf, R. D., Reed, R. A., Bhuva, B. L., Griffoni, A., Simoen, E., Aoulaiche, M., Linten, D., Jurczak, M., Groeseneken, G.

Year:

2012

Language:

english

File:

PDF, 754 KB

english, 2012

9

Kernel-Based Circuit Partition Approach to Mitigate Combinational Logic Soft Errors

Mahatme, N. N., Gaspard, N. J., Assis, T., Chatterjee, I., Loveless, T. D., Bhuva, B. L., Robinson, W. H., Massengill, L. W., Wen, S.-J., Wong, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

2014

Language:

english

File:

PDF, 829 KB

english, 2014

10

[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Analysis of soft error rates in combinational and sequential logic and implications of hardening for advanced technologies

Mahatme, N. N., Chatterjee, I., Bhuva, B. L., Ahlbin, J., Massengill, L. W, Shuler, R.

Year:

2010

Language:

english

File:

PDF, 541 KB

english, 2010

11

Analysis of TGF-β1 Gene Expression in Contused Rat Spinal Cord Using Quantitative RT-PCR

SEMPLE-ROWLAND, SUSAN L., MAHATME, ARVIND, POPOVICH, PHILLIP G., GREEN, DANIEL A., HASSLER, GREGG, STOKES, BRADFORD T., STREIT, WOLFGANG J.

Journal:

Journal of Neurotrauma

Year:

1995

Language:

english

File:

PDF, 4.90 MB

english, 1995

12

[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Impact of technology scaling on the combinational logic soft error rate

Mahatme, N. N., Gaspard, N. J., Assis, T., Jagannathan, S., Chatterjee, I., Loveless, T. D., Bhuva, B. L., Massengill, L. W., Wen, S. J., Wong, R.

Year:

2014

Language:

english

File:

PDF, 145 KB

english, 2014

13

Geometry Dependence of Total-Dose Effects in Bulk FinFETs

Chatterjee, I., Zhang, E. X., Bhuva, B. L., Reed, R. A., Alles, M. L., Mahatme, N. N., Ball, D. R., Schrimpf, R. D., Fleetwood, D. M., Linten, D., Simoen, E., Mitard, J., Claeys, C.

Journal:

IEEE Transactions on Nuclear Science

Year:

2014

Language:

english

File:

PDF, 1.27 MB

english, 2014

14

Effects of Threshold Voltage Variations on Single-Event Upset Response of Sequential Circuits at Advanced Technology Nodes

Zhang, Hangfang, Jiang, Hui, Assis, Thiago R., Mahatme, Nihaar N., Narasimham, Balaji, Massengill, Lloyd W., Bhuva, Bharat L., Wen, Shi-Jie, Wong, Richard

Journal:

IEEE Transactions on Nuclear Science

Year:

2017

Language:

english

File:

PDF, 793 KB

english, 2017

15

Effects of Temperature and Supply Voltage on SEU- and SET-Induced Errors in Bulk 40-nm Sequential Circuits

Chen, R. M., Diggins, Z. J., Mahatme, N. N., Wang, Liang, Zhang, En Xia, Chen, Y. P., Zhang, Hangfang, Liu, Y. N., Narasimham, Balaji, Witulski, Arthur F., Bhuva, Bharat L., Fleetwood, Dan M.

Journal:

IEEE Transactions on Nuclear Science

Year:

2017

Language:

english

File:

PDF, 791 KB

english, 2017

16

[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Temperature dependence of soft error rate in flip-flop designs

Jagannathan, S., Diggins, Z., Mahatme, N., Loveless, T. D., Bhuva, B. L., Wen, S-J., Wong, R., Massengill, L. W.

Year:

2012

Language:

english

File:

PDF, 2.61 MB

english, 2012

17

Clinical effectiveness and safety of cetirizine versus rupatadine in chronic spontaneous urticaria: a randomized, double-blind, 6-week trial

Dakhale, Ganesh N., Shinde, Abhijit T., Mahatme, Mohini S., Hiware, Sachin K., Mishra, Dharmendra B., Mukhi, Jayesh I., Salve, Anoop M.

Journal:

International Journal of Dermatology

Year:

2014

Language:

english

File:

PDF, 107 KB

english, 2014

18

[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Soft error rate comparison of various hardened and non-hardened flip-flops at 28-nm node

Gaspard, N., Jagannathan, S., Diggins, Z. J., Mahatme, N. N., Loveless, T. D., Bhuva, B. L., Massengill, L. W., Holman, W. T., Narasimham, B., Oates, A., Marcoux, P., Tam, N., Vilchis, M., Wen, S.-J.,

Year:

2014

Language:

english

File:

PDF, 264 KB

english, 2014

19

Reliability-Aware Synthesis of Combinational Logic With Minimal Performance Penalty

Limbrick, Daniel B., Mahatme,, Robinson,, Bhuva,

Journal:

IEEE Transactions on Nuclear Science

Year:

2013

Language:

english

File:

PDF, 597 KB

english, 2013

20

Impact of Supply Voltage and Frequency on the Soft Error Rate of Logic Circuits

Mahatme, N. N., Gaspard, N. J., Jagannathan, S., Loveless, T. D., Bhuva, B. L., Robinson, W. H., Massengill, L. W., Wen, S.-J., Wong, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

2013

Language:

english

File:

PDF, 692 KB

english, 2013

21

[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Effect of interface states on 1T-FBRAM cell retention

Aoulaiche, M., Collaert, N., Blomme, P., Simoen, E., Altimime, L., Groeseneken, G., Jurczak, M., Mendes Almeida, L., Caillat, Ch., Mahatme, N.N.

Year:

2012

Language:

english

File:

PDF, 462 KB

english, 2012

22

Spontaneous version and retrograde migration of a foreign body

P. L. Verma, N. R. Patil, K. H. Mahatme

Journal:

Indian Journal of Otolaryngology and Head & Neck Surgery (Springer)

Year:

1978

Language:

english

File:

PDF, 460 KB

english, 1978

23

Virus reactivation: a panoramic view in human infections

Traylen, Christopher M, Patel, Hersh R, Fondaw, Wylder, Mahatme, Sheran, Williams, John F, Walker, Lia R, Dyson, Ossie F, Arce, Sergio, Akula, Shaw M

Journal:

Future Virology

Year:

2011

Language:

english

File:

PDF, 1.11 MB

english, 2011

24

Scalability of Capacitive Hardening for Flip-Flops in Advanced Technology Nodes

Diggins, Z. J., Gaspard, N. J., Mahatme, N. N., Jagannathan, S., Loveless, T. D., Reece, T. R., Bhuva, B. L., Witulski, A. F., Massengill, L. W., Wen, S.-J., Wong, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

2013

Language:

english

File:

PDF, 429 KB

english, 2013

25

Single-Event Charge Collection and Upset in 40-nm Dual- and Triple-Well Bulk CMOS SRAMs

Chatterjee, Indranil, Narasimham, Balaji, Mahatme, Nihaar N., Bhuva, Bharat L., Schrimpf, Ronald D., Wang, Jung K., Bartz, Bartz, Pitta, Eswara, Buer, Myron

Journal:

IEEE Transactions on Nuclear Science

Year:

2011

Language:

english

File:

PDF, 1.09 MB

english, 2011

26

[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - Terrestrial SER characterization for nanoscale technologies: A comparative study

Mahatme, N. N., Bhuva, B., Gaspard, N., Assis, T., Xu, Y., Marcoux, P., Vilchis, M., Narasimham, B., Shih, A., Wen, S.-J., Wong, R., Tam, N., Shroff, M., Koyoma, S., Oates, A.

Year:

2015

Language:

english

File:

PDF, 468 KB

english, 2015

27

Influence of Voltage and Particle LET on Timing Vulnerability Factors of Circuits

Mahatme, N. N., Rui, L., Wang, H., Chen, L., Bhuva, B. L., Robinson, W. H., Massengill, L. W., Lilja, K., Bounasser, M., Wen, S.-J., Wong, R.

Journal:

IEEE Transactions on Nuclear Science

Year:

2015

Language:

english

File:

PDF, 876 KB

english, 2015

28

[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - Evaluation on flip-flop physical unclonable functions in a 14/16-nm bulk FinFET technology

Zhang, H., Jiang, H., Eaker, M. R., Lezon, K. J., Narasimham, B., Mahatme, N. N., Massengill, L. W., Bhuva, B. L.

Year:

2018

Language:

english

File:

PDF, 269 KB

english, 2018

29

[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Analysis of multiple cell upsets due to neutrons in SRAMs for a Deep-N-well process

Mahatme, Nihaar, Bhuva, Bharat, Fang, Y-P, Oates, Anthony

Year:

2011

Language:

english

File:

PDF, 422 KB

english, 2011

30

Impact of Technology Scaling on SRAM Soft Error Rates

Chatterjee, I., Narasimham, B., Mahatme, N. N., Bhuva, B. L., Reed, R. A., Schrimpf, R. D., Wang, J. K., Vedula, N., Bartz, B., Monzel, C.

Journal:

IEEE Transactions on Nuclear Science

Year:

2014

Language:

english

File:

PDF, 1.30 MB

english, 2014

31

[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - High-speed pulsed-hysteresis-latch design for improved SER performance in 20 nm bulk CMOS process

Narasimham, Balaji, Chandrasekharan, Karthik, Wang, Jung K., Djaja, Gregory, Gaspard, Nelson J., Mahatme, Nihaar N., Assis, Thiago R., Bhuva, Bharat L.

Year:

2014

Language:

english

File:

PDF, 325 KB

english, 2014

32

[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - A critical re-examination of body-bias on the soft error rate and single-event latch-up in automotive SRAMs

Mahatme, N. N., Min, B., Loiko, K.

Year:

2017

Language:

english

File:

PDF, 318 KB

english, 2017

33

AIP Conference Proceedings [Author(s) INTERNATIONAL CONFERENCE ON “MULTIDIMENSIONAL ROLE OF BASIC SCIENCE IN ADVANCED TECHNOLOGY” ICMBAT 2018 - Nagpur, India (14–15 December 2018)] - Effect of oxidant, dopant and MO additive loading on morphology, conductivity and dielectric constant of 3D conducting polymer PPy/α-Fe2O3 nanocomposites

Mahatme, U. B., Gedam, R. S., Tidke, G. D., Utane, R. D., Bhange, A. C.

Year:

2019

File:

PDF, 1.59 MB

2019

34

Sensitivity of High-Frequency RF Circuits to Total Ionizing Dose Degradation

Jagannathan, S., Loveless, T. D., Zhang, E. X., Fleetwood, D. M., Schrimpf, R. D., Haeffner, T. D., Kauppila, J. S., Mahatme, N., Bhuva, B. L., Alles, M. L., Holman, W. T., Witulski, A. F., Massengill

Journal:

IEEE Transactions on Nuclear Science

Year:

2013

Language:

english

File:

PDF, 1.23 MB

english, 2013

35

[IEEE 2016 IEEE International Reliability Physics Symposium (IRPS) - Pasadena, CA, USA (2016.4.17-2016.4.21)] 2016 IEEE International Reliability Physics Symposium (IRPS) - Hardware based empirical model for predicting logic soft error cross-section

Jagannathan, S., Mahatme, N. N., Gaspard, N. J., Loveless, T. D., Bhuva, B. L., Massengill, L. W.

Year:

2016

Language:

english

File:

PDF, 509 KB

english, 2016

36

Impact of Temporal Masking of Flip-Flop Upsets on Soft Error Rates of Sequential Circuits

chen, Rongmei, Mahatme, N.N., Diggins, Zachary, Wang, Liang, Zhang, En Xia, Chen, Yanran P., Liu, Yi, Narasimham, Balaji, Witulski, Arthur F., Bhuva, Bharat L., Fleetwood, Dan

Journal:

IEEE Transactions on Nuclear Science

Year:

2017

Language:

english

File:

PDF, 1.23 MB

english, 2017

37

[IEEE 2016 16th European Conference on Radiation and its Effects on Components and Systems (RADECS) - Bremen (2016.9.19-2016.9.23)] 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Impact of particle LET on combinational logic single-event effects for advanced technologies

Jiang, Hui, Zhang, Hangfang, Mahatme, Nihaar N., Chatterjee, Indranil, Assis, Thiago R., Kauppila, Jeff S., Bhuva, Bharat L., Massengill, Lloyd W.

Year:

2016

Language:

english

File:

PDF, 1.04 MB

english, 2016

38

Stages of development of traditional simulation unit of surgery for manual extra capsular cataract extraction in sub-Saharan African region

Bilong, Yannick, Mahatme, Vikas, Nanfack, Ngoune, Bella, Lucienne Assumpta, Mvogo, Côme Ebana

Journal:

Pan African Medical Journal

Year:

2017

Language:

english

File:

PDF, 337 KB

english, 2017

39

Effects of Total-Ionizing-Dose Irradiation on SEU- and SET-Induced Soft Errors in Bulk 40-nm Sequential Circuits

Chen, Rong Mei, Diggins, Zachary J., Mahatme, N. N., Wang, Liang, Zhang, En Xia, Chen, Yanran P., Liu, Yi N., Narasimham, Balaji, Witulski, Arthur F., Bhuva, Bharat L., Fleetwood, Dan M.

Journal:

IEEE Transactions on Nuclear Science

Year:

2016

Language:

english

File:

PDF, 478 KB

english, 2016

40

Impact of Back-Gate Bias and Device Geometry on the Total Ionizing Dose Response of 1-Transistor Floating Body RAMs

Mahatme, N. N., Zhang, E. X., Reed, R. A., Bhuva, B. L., Schrimpf, R. D., Fleetwood, D. M., Linten, D., Simoen, E., Griffoni, A., Aoulaiche, M., Jurczak, M., Groeseneken, G.

Journal:

IEEE Transactions on Nuclear Science

Year:

2012

Language:

english

File:

PDF, 1.06 MB

english, 2012

41

Impact of Strained-Si PMOS Transistors on SRAM Soft Error Rates

Mahatme, Nihaar N., Bhuva, Bharat L., Fang, Yi-Pin, Oates, Anthony S.

Journal:

IEEE Transactions on Nuclear Science

Year:

2012

Language:

english

File:

PDF, 639 KB

english, 2012

42

Medical Store Management: An Integrated Economic Analysis of a Tertiary Care Hospital in Central India

Mahatme, M.S., Hiware, S.K., Shinde, A.T., Salve, A.M., Dakhale, G.N.

Journal:

Journal of Young Pharmacists

Year:

2012

Language:

english

File:

PDF, 492 KB

english, 2012

43

Single-Event Transient Sensitivity Evaluation of Clock Networks at 28-nm CMOS Technology

Wang, H.-B., Mahatme, N., Chen, L., Newton, M., Li, Y.-Q., Liu, R., Chen, M., Bhuva, B. L., Lilja, K., Wen, S.-J., Wong, R., Fung, R., Baeg, S.

Journal:

IEEE Transactions on Nuclear Science

Year:

2016

Language:

english

File:

PDF, 1.03 MB

english, 2016

44

[IEEE 2017 International Conference on Computing Methodologies and Communication (ICCMC) - Erode, India (2017.7.18-2017.7.19)] 2017 International Conference on Computing Methodologies and Communication (ICCMC) - Detection and recognition of traffic signs based on RGB to red conversion

Mahatme, Mohit Bhairav, Kuwelkar, Mrs. Sonia

Year:

2017

Language:

english

File:

PDF, 360 KB

english, 2017

45

[IEEE 2016 16th European Conference on Radiation and its Effects on Components and Systems (RADECS) - Bremen (2016.9.19-2016.9.23)] 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Analysis of temporal masking effect on single-event upset rates for sequential circuits

Chen, R. M., Diggins, Z. J., Mahatme, N. N., Wang, L., Zhang, E. X., Chen, Y. P., Liu, Y. N., Narasimham, B., Witulski, A. F., Bhuva, B. L.

Year:

2016

Language:

english

File:

PDF, 1.16 MB

english, 2016

46

A novel “patient-like” model of cholangiocarcinoma progression based on bile duct inoculation of tumorigenic rat cholangiocyte cell lines

Alphonse E. Sirica, Zichen Zhang, Guan-Hua Lai, Toru Asano, Xue-Ning Shen, Deanna J. Ward, Arvind Mahatme, Jennifer L. DeWitt

Journal:

Year:

2008

Language:

english

File:

PDF, 1.10 MB

english, 2008

47

Experimental Estimation of the Window of Vulnerability for Logic Circuits

Mahatme, N. N., Gaspard, N. J., Jagannathan, S., Loveless, T. D., Chatterjee, I., Bhuva, B. L., Massengill, L. W., Schrimpf, R. D.

Journal:

IEEE Transactions on Nuclear Science

Year:

2013

Language:

english

File:

PDF, 846 KB

english, 2013

48

[IEEE 2016 World Conference on Futuristic Trends in Research and Innovation for Social Welfare (Startup Conclave) - Coimbatore, India (2016.2.29-2016.3.1)] 2016 World Conference on Futuristic Trends in Research and Innovation for Social Welfare (Startup Conclave) - Reconfigurable filtenna in UHF band for cognitive radio application

Mahatme, Madhura, Narlawar, Milind S.

Year:

2016

File:

PDF, 424 KB

2016

49

[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA (2013.4.14-2013.4.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - Estimating the frequency threshold for logic soft errors

Mahatme, N. N., Gaspard, N. J., Jagannathan, S., Loveless, T. D., Abdel-Aziz, H., Bhuva, B. L., Massengill, L. W., Wen, S., Wong, R.

Year:

2013

Language:

english

File:

PDF, 166 KB

english, 2013

50

[IEEE 2016 IEEE International Reliability Physics Symposium (IRPS) - Pasadena, CA, USA (2016.4.17-2016.4.21)] 2016 IEEE International Reliability Physics Symposium (IRPS) - Exploiting low power circuit topologies for soft error mitigation

Mahatme, N. N., Chatterjee, I., Jagannathan, S., Gaspard, N., Assis, T., Wen, S.-J., Wong, R., Bhuva, B. L.

Year:

2016

Language:

english

File:

PDF, 331 KB

english, 2016

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